In white-light interference microscopy, measurement of surface shape generally requires peak extraction of the fringe function envelope. In this paper the Teager-Kaiser energy and higher-order energy operators are proposed for efficient extraction of the fringe envelope. These energy operators are compared in terms of precision, robustness to noise, and subsampling. Flexible energy operators, depending on order and lag parameters, can be obtained. Results show that smoothing and interpolation of envelope approximation using spline model performs better than Gaussian-based approach.
Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement
1 Université Louis Pasteur Laboratoire Phase, CNRS/STIC-UPR 292, 23 rue du Loess, BP 20, Strasbourg Cedex 2 67037, France
2 IRENav, École Navale, Lanvéoc Poulmic, BP 600, 29240 Brest-Armées, France
EURASIP Journal on Advances in Signal Processing 2005, 2005:731636 doi:10.1155/ASP.2005.2804
The electronic version of this article is the complete one and can be found online at: http://asp.eurasipjournals.com/content/2005/17/731636
|Received:||10 November 2004|
|Revisions received:||26 April 2005|
|Published:||23 October 2005|
© 2005 Salzenstein et al.